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參數資料
| 型號： | GS9064-CKD |
| 廠商： | Gennum Corporation |
| 英文描述： | GS9064 SD SDI Adaptive Cable Equalizer |
| 中文描述： | GS9064標清SDI自適應電纜均衡器 |
| 文件頁數： | 4/10頁 |
| 文件大小： | 162K |
| 代理商： | GS9064-CKD |
GENNUM CORPORATION
22212 - 2
4 of 10
G
2. ELECTRICAL CHARACTERISTICS
2.1
ABSOLUTE MAXIMUM RATINGS
PARAMETER
VALUE
Supply Voltage
-0.5V to +3.6 V
DC
Input ESD Voltage
500V
Storage Temperature Range
-50°C< T
s
< 125°C
Input Voltage Range (any input)
-0.3 to (V
CC
+ 0.3)V
Operating Temperature Range
0°C to 70°C
Power Dissipation
300mW
Lead Temperature (soldering, 10 sec.)
260°C
2.2 DC ELECTRICAL CHARACTERISTICS
V
CC
= 3.3V , V
EE
= 0V , T
A
= 0
°C to 70°C
, 270Mb/s, unless otherwise shown
PARAMETER
SYMBOL
CONDITIONS
MIN
TYPICAL
MAX
UNITS
TEST
LEVEL
NOTES
Supply Voltage
V
CC
3.1
3.3
3.5
V
1
-
Power Consumption
P
D
T
A
= 25°C
-
265
-
mW
5
-
Supply Current
Ι
S
T
A
= 25°C
-
80
-
mA
1
-
Input Common Mode Voltage
V
CMIN
-
1.75
-
V
10
-
Output Common Mode Voltage
V
CMOUT
-
V
CC
-
V
SDO
/2
-
mV
7
-
CLI DC Voltage
Cable length = 0m
-
2.5
-
V
1
-
No signal (max
cable length)
-
1.9
-
V
7
-
Floating MCLADJ DC Voltage
-
1.3
-
V
7
-
MCLADJ Range
0m to max cable
length
-
0.69
-
V
7
-
CD/Mute Output Voltage
V
CD/Mute(OH)
Carrier not present
2.6
-
-
V
1
-
V
CD/Mute(OL)
Carrier present
-
-
1.2
1
-
CD/Mute Input Voltage
Required to Force Outputs to
Mute
V
CD/Mute)
Min to Mute
3.0
-
-
V
7
-
CD/Mute Input Voltage
Required to Force Outputs to
Activate
V
CD/Mute
Max to Activate
-
-
2.0
V
7
-
TEST LEVELS
1.
Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges.
2.
Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges using
correlated test.
3.
Production test at room temperature and nominal supply voltage.
4.
QA sample test.
5.
Calculated result based on Level 1, 2, or 3.
6.
Not tested. Guaranteed by design simulations.
7.
Not tested. Based on characterization of nominal parts.
8.
Not tested. Based on existing design/characterization data of similar product.
9.
Indirect test.
10. Wafer Probe
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