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參數(shù)資料
| 型號(hào)： | MC78T08CT |
| 廠商： | ON SEMICONDUCTOR |
| 元件分類： | 基準(zhǔn)電壓源/電流源 |
| 英文描述： | THREE-TERMINAL POSITIVE FIXED VOLTAGE REGULATORS |
| 中文描述： | 8 V FIXED POSITIVE REGULATOR, PSFM3 |
| 封裝： | TO-220, 3 PIN |
| 文件頁(yè)數(shù)： | 3/12頁(yè) |
| 文件大小： | 162K |
| 代理商： | MC78T08CT |
MC78T00 Series
3
MOTOROLA ANALOG IC DEVICE DATA
ELECTRICAL CHARACTERISTICS
(Vin = 13 V, IO = 3.0 A, 0
°
C
≤
TJ
≤
125
°
C, PO
≤
Pmax [Note 1], unless otherwise noted.)
MC78T08C
Characteristics
Symbol
Min
Typ
Max
Unit
Output Voltage
(5.0 mA
≤
IO
≤
3.0 A, TJ = +25
°
C)
(5.0 mA
≤
IO
≤
3.0 A;
5.0 mA
≤
IO
≤
2.0 A, 10.4 Vdc
≤
Vin
≤
23 Vdc)
VO
7.7
7.6
8.0
8.0
8.3
8.4
Vdc
Line Regulation (Note 2)
(10.3 Vdc
≤
Vin
≤
35 Vdc, IO = 5.0 mA, TJ = +25
°
C
10.3 Vdc
≤
Vin
≤
35 Vdc, IO = 1.0 A, TJ = +25
°
C
11 Vdc
≤
Vin
≤
17 Vdc, IO = 3.0 A, TJ = +25
°
C
10.7 Vdc
≤
Vin
≤
23 Vdc, IO = 1.0 A)
Load Regulation (Note 2)
(5.0 mA
≤
IO
≤
3.0 A, TJ = +25
°
C)
(5.0 mA
≤
IO
≤
3.0 A)
Regline
–
4.0
35
mV
Regload
–
–
10
15
30
80
mV
Thermal Regulation
(Pulse = 10 ms, P = 20 W, TA = +25
°
C)
Regtherm
–
0.002
0.03
%VO/W
Quiescent Current
(5.0 mA
≤
IO
≤
3.0 A, TJ = +25
°
C)
(5.0 mA
≤
IO
≤
3.0 A)
IB
–
–
3.5
4.0
5.0
6.0
mA
Quiescent Current Change
(10.3 Vdc
≤
Vin
≤
35 Vdc, IO = 5.0 mA, TJ = +25
°
C;
5.0 mA
≤
IO
≤
3.0 A, TJ = +25
°
C;
10.7 Vdc
≤
Vin
≤
23 Vdc, IO = 1.0 A)
IB
–
0.3
1.0
mA
Ripple Rejection
(11 Vdc
≤
Vin
≤
21 Vdc, f = 120 Hz, IO = 2.0 A, TJ = 25
°
C)
RR
60
71
–
dB
Dropout Voltage (IO = 3.0 A, TJ = +25
°
C)
Output Noise Voltage
(10 Hz
≤
f
≤
100 kHz, TJ = +25
°
C)
Vin–VO
Vn
–
2.2
2.5
Vdc
–
10
–
μ
V/VO
Output Resistance (f = 1.0 kHz)
RO
ISC
–
2.0
–
m
Short Circuit Current Limit
(Vin = 35 Vdc, TJ = +25
°
C)
–
1.5
–
A
Peak Output Current (TJ = +25
°
C)
Average Temperature Coefficient of Output Voltage (IO = 5.0 mA)
Imax
TCVO
–
5.0
–
A
–
0.3
–
mV/
°
C
NOTES:
1.Although power dissipation is internally limited, specifications apply only for PO
≤
Pmax, Pmax = 25 W.
2.Line and load regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately.
Pulse testing with low duty cycle is used.
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