
White Microelectronics Phoenix, AZ (602) 437-1520
7
F
5
WF128K16, WF256K16-XCX5
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS, CS CONTROLLED
(V
CC
= 5.0V, V
SS
= 0V, T
A
= -55
°
C to +125
°
C)
Parameter
Symbol
-50
-60
-70
-90
-120
-150
Min
150
Unit
Min
50
Max
Min
60
Max
Min
70
Max
Min
90
Max
Min
120
Max
Max
Write Cycle Time
t
AVAV
t
WC
ns
WE Setup Time
t
WLEL
t
WS
0
0
0
0
0
0
ns
CS Pulse Width
t
ELEH
t
CP
25
30
35
45
50
50
ns
Address Setup Time
t
AVEL
t
AS
0
0
0
0
0
0
ns
Data Setup Time
t
DVEH
t
DS
25
30
30
45
50
50
ns
Data Hold Time
t
EHDX
t
DH
0
0
0
0
0
0
ns
Address Hold Time
t
ELAX
t
AH
40
45
45
45
50
50
ns
WE Hold from WE High
t
EHWH
t
WH
0
0
0
0
0
0
ns
CS Pulse Width High
t
EHEL
t
CPH
20
20
20
20
20
20
ns
Duration of Programming Operation
t
WHWH1
14
14
14
14
14
14
μ
s
Duration of Erase Operation
t
WHWH2
2.2
60
2.2
60
2.2
60
2.2
60
2.2
60
2.2
60
sec
Read Recovery before Write
t
GHEL
0
0
0
0
0
0
ns
Chip Programming Time
12.5
12.5
12.5
12.5
12.5
12.5
sec
FIG. 2
AC TEST CIRCUIT
NOTES:
V
Z
is programmable from -2V to +7V.
I
OL
& I
OH
programmable from 0 to 16mA.
Tester Impedance Z
0
= 75
.
V
Z
is typically the midpoint of V
OH
and V
OL
.
I
OL
& I
OH
are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
AC TEST CONDITIONS
I
Current Source
D.U.T.
C = 50 pf
I
OL
V
≈
1.5V
(Bipolar Supply)
Z
Current Source
OH
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
Output Timing Reference Level
Typ
Unit
V
ns
V
V
V
IL
= 0, V
IH
= 3.0
5
1.5
1.5