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參數資料
| 型號： | EPF10K100EQC240-3N |
| 廠商： | Altera |
| 文件頁數： | 40/100頁 |
| 文件大小： | 0K |
| 描述： | IC FLEX 10KE FPGA 100K 240-PQFP |
| 產品培訓模塊： | Three Reasons to Use FPGA's in Industrial Designs |
| 標準包裝： | 24 |
| 系列： | FLEX-10KE® |
| LAB/CLB數： | 624 |
| 邏輯元件/單元數： | 4992 |
| RAM 位總計： | 49152 |
| 輸入/輸出數： | 189 |
| 門數： | 257000 |
| 電源電壓： | 2.375 V ~ 2.625 V |
| 安裝類型： | 表面貼裝 |
| 工作溫度： | 0°C ~ 85°C |
| 封裝/外殼： | 240-BFQFP |
| 供應商設備封裝： | 240-PQFP（32x32） |
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44
Altera Corporation
FLEX 10KE Embedded Programmable Logic Devices Data Sheet
IEEE Std.
1149.1 (JTAG)
Boundary-Scan
Support
All FLEX 10KE devices provide JTAG BST circuitry that complies with the
IEEE Std. 1149.1-1990 specification. FLEX 10KE devices can also be
configured using the JTAG pins through the BitBlaster or ByteBlasterMV
download cable, or via hardware that uses the JamTM STAPL
programming and test language. JTAG boundary-scan testing can be
performed before or after configuration, but not during configuration.
FLEX 10KE devices support the JTAG instructions shown in Table 15.
The instruction register length of FLEX 10KE devices is 10 bits. The
USERCODE register length in FLEX 10KE devices is 32 bits; 7 bits are
show the boundary-scan register length and device IDCODE information
for FLEX 10KE devices.
Table 15. FLEX 10KE JTAG Instructions
JTAG Instruction
Description
SAMPLE/PRELOAD
Allows a snapshot of signals at the device pins to be captured and examined during
normal device operation, and permits an initial data pattern to be output at the device
pins.
EXTEST
Allows the external circuitry and board-level interconnections to be tested by forcing a
test pattern at the output pins and capturing test results at the input pins.
BYPASS
Places the 1-bit bypass register between the TDI and TDO pins, which allows the BST
data to pass synchronously through a selected device to adjacent devices during normal
device operation.
USERCODE
Selects the user electronic signature (USERCODE) register and places it between the
TDI
and TDO pins, allowing the USERCODE to be serially shifted out of TDO.
IDCODE
Selects the IDCODE register and places it between TDI and TDO, allowing the IDCODE
to be serially shifted out of TDO.
ICR Instructions
These instructions are used when configuring a FLEX 10KE device via JTAG ports with
a BitBlaster or ByteBlasterMV download cable, or using a Jam File (.jam) or
Jam Byte-Code File (.jbc) via an embedded processor.
Table 16. FLEX 10KE Boundary-Scan Register Length
Device
Boundary-Scan Register Length
EPF10K30E
690
EPF10K50E
EPF10K50S
798
EPF10K100E
1,050
EPF10K130E
1,308
EPF10K200E
EPF10K200S
1,446
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| EPF10K100EQI208-1DX | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:ASIC |
| EPF10K100EQI208-2 | 功能描述:FPGA - 現場可編程門陣列 FPGA - Flex 10K 624 LABs 147 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數量: 邏輯塊數量:943 內嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風格:SMD/SMT 封裝 / 箱體:FBGA-256 |
| EPF10K100EQI208-2DX | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:ASIC |
| EPF10K100EQI208-3DX | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:ASIC |
| EPF10K100EQI240-1DX | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:ASIC |
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